HF data carrier, high temperature. Before use, high-temperature data carriers must be subjected to a sufficient suitability test in the form of stress tests in the respective intended temperature processes., The following stress test was carried out on this data carrier:¿Cyclic temperature load: 20 min. at 20 °C - 20 min. at 220 °C¿Number of cycles tested: 1500¿This successfully conducted test does not imply suitability for a specific high-temperature application, but merely serves as proof of basic usability., The TH-Q51S-HT and TH-Q51T-HT holders protect the data carrier from mechanical stress and at the same time enable mounting on metal., EEPROM, memory size 128 bytes, Not suitable for direct mounting on metal